P156 ICT Probe with B/U/G/J/F Tip Styles Probe Pins

P156  ICT Probe with B/U/G/J/F Tip Styles Probe Pins

        In-circuit test probes are mainly used for testing the electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistance, capacitance, inductance, crystal oscillators, and perform functional tests of diode, triode, optocoupler, transformer, relay, operational amplifier, power supply module and integrated circuits.

        This product is classified into the P156 series of P series ICT probes manufactured by Centalic. Its test centers is 156 mil and diameter is 2.36 mm. The total length is 33.79 mm and the exposed plunger is 8.89 mm in length. There are three optional receptacles, namely CR, SC and WW, and various tip styles.